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JEM-ARM200F NEOARM Atomic Resolution Analytical Electron Microscope

We have adopted our new concept colors, Pure White and JEOL Silver, resulting in a more refined form design.

NEOARM, developed by Japan Electron Optics Corporation, is equipped with a cold field emission electron gun (Cold-FEG) developed with our unique technology and a new spherical aberration corrector (ASCOR) capable of correcting up to higher-order aberrations, enabling atomic resolution observation not only at a high acceleration voltage of 200 kV but also at a low acceleration voltage of 30 kV. Additionally, we have developed our proprietary aberration correction algorithm and incorporated a system that automatically performs fast and accurate aberration correction. This provides high-throughput atomic resolution observation. 〇 Features - Spherical aberration corrector ASCOR (Advanced STEM corrector) - Automatic aberration correction software JEOL COSMO (Corrector System Module) - New ABF (Annular Bright Field) detector system - Perfect sight detector *For more details, please download the PDF or feel free to contact us.